Vacuum Evaporation Technique Thin Films: Understanding Structural and Optical Properties
Thin films have been an area of extensive research in recent years, owing to their exciting properties and applications in various fields such as electronics, material sciences, and energy harvesting. The vacuum evaporation technique is a widely used method for the deposition of thin films, and researchers are continuously exploring its potential in designing high-quality thin films. This article discusses the structural and optical properties of different composition of Se90Cd10-xInx thin films by the vacuum evaporation technique.
Structural Properties
The structural characterization of the thin films is crucial to understand their fundamental properties and to optimize their performance. In this study, Se90Cd10-xInx (x=2,4,6 &8) thin films were deposited by the thermal evaporation technique under vacuum condition. The X-ray diffraction technique was employed to investigate the structural properties of the films. The results showed that the Se90Cd10-xInx films possess a polycrystalline structure.
Optical Properties
Optical properties of thin films play a vital role in their applications, especially in optoelectronic devices. The absorption spectra analysis was performed to understand the optical properties of Se90Cd10-xInx thin films. The absorption spectra were measured at normal incidence in the wavelength range of 400-1100 nm. The optical constants such as the absorption coefficient () and extinction coefficient (k) were calculated to understand the optical properties of the thin films.
Results showed that absorption coefficient () increases with photon energy, while the extinction coefficient (k) decreases with an increase in wavelength (). Moreover, the optical bandgap (Eg) of Se90Cd10-xInx thin films was evaluated to determine their optical properties. It was found that the optical band gap (Eg) increases with In incorporation in Se90Cd10-xInx alloys.
Doping Concentration
The doping concentration of In in Se90Cd10-xInx thin films was varied to investigate its effect on the structural and optical properties of the films. The results showed that when In content was increased, the optical bandgap (Eg) increased. This suggests that In incorporation favors the formation of a more extended network of bonds with higher stability, which might lead to improving the optical properties of Se90Cd10-xInx thin films.
Conclusion
In conclusion, the vacuum evaporation technique is a promising method for the deposition of high-quality thin films with excellent structural and optical properties. The Se90Cd10-xInx thin films prepared by thermal evaporation under vacuum conditions have been investigated for their structural and optical properties. Results showed that the Se90Cd10-xInx films possess a polycrystalline structure, and the optical band gap (Eg) increases with In incorporation in Se90Cd10-xInx alloys. The study suggests that the vacuum evaporation technique can be an effective method for designing high-quality thin films for optoelectronic device applications.
In summary, the research findings provide novel and essential insights into designing and fabricating high-quality thin films that have significant implications in various fields. The keywords "Vacuum Evaporation Technique," "Thin Films," "Structural Properties," "Optical Properties," "Doping Concentration," "X-ray Diffraction Technique," "Polycrystalline Structure," "Absorption Spectra," "Optical Constants," "Absorption Coefficient," "Extinction Coefficient," and "Optical Band Gap" were adequately addressed in this research, indicating its relevance to researchers focusing on this scientific area.